Abstract
The spontaneous emission spectra of diode laser structures were measured. The validation of the process was confirmed by comparison with the true spontaneous emission spectrum observed through a top-contact window. The spontaneous emission spectra were converted into real units, when the carrier populations were inverted at low photon energy. This method can be used to determine the spontaneous emission spectrum for TM polarized light.
| Original language | English (US) |
|---|---|
| Title of host publication | Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS |
| Pages | 655-656 |
| Number of pages | 2 |
| Volume | 2 |
| State | Published - 2001 |
| Event | 14th Annual Meeting of the IEEE Lasers and Electro-Optics Society - San Diego, CA, United States Duration: Nov 11 2001 → Nov 15 2001 |
Other
| Other | 14th Annual Meeting of the IEEE Lasers and Electro-Optics Society |
|---|---|
| Country/Territory | United States |
| City | San Diego, CA |
| Period | 11/11/01 → 11/15/01 |
ASJC Scopus subject areas
- Control and Systems Engineering
- Electrical and Electronic Engineering
- Industrial and Manufacturing Engineering