TY - JOUR
T1 - Surface morphology and surface chemical states of epitaxial Pb(Zr0.95Ti0.05)O3 thin films grown on SrTiO3(100) by sputter deposition
AU - Lu, C. J.
AU - Shen, H. M.
AU - Wang, Y. N.
AU - Gu, J. H.
PY - 1998
Y1 - 1998
N2 - Epitaxial Pb(Zr0.95Ti0.05)O3 thin films of an orthorhombic perovskite structure were obtained on SrTiO3(100) substrates by radio frequency sputter deposition. The surface morphology of the films was investigated with atomic force microscopy, scanning electron microscopy, and reflection electron microscopy. It is shown that the film surfaces are rather bumpy. There are undulations of about 400 nm in length in an in-plane direction. The mean roughness perpendicular to the surface is 39.6nm, for the film thickness of 0.45 μm. The surface roughening was probably caused by island-shaped nucleation and growth during the film growth. It has also been found that some gorges and a number of small pits remain at the film surfaces. The surface chemical states of the films were characterized by using X-ray photoelectron spectroscopy. A Pb enrichment layer and a large amount of adsorbed oxygen have been found at the surfaces of the films. Near the film surface Pb and Zr exist mainly in the forms of, besides Pb(Zr, Ti)03, metal Pb, metal Zr, oxygen-chemisorbed Pb, and various lead oxides. In addition, a small amount of lead, whose binding energy of Pb 4f7/2 is much lower than that of metal Pb, was observed at the film surfaces, but its chemical state is unknown up to now.
AB - Epitaxial Pb(Zr0.95Ti0.05)O3 thin films of an orthorhombic perovskite structure were obtained on SrTiO3(100) substrates by radio frequency sputter deposition. The surface morphology of the films was investigated with atomic force microscopy, scanning electron microscopy, and reflection electron microscopy. It is shown that the film surfaces are rather bumpy. There are undulations of about 400 nm in length in an in-plane direction. The mean roughness perpendicular to the surface is 39.6nm, for the film thickness of 0.45 μm. The surface roughening was probably caused by island-shaped nucleation and growth during the film growth. It has also been found that some gorges and a number of small pits remain at the film surfaces. The surface chemical states of the films were characterized by using X-ray photoelectron spectroscopy. A Pb enrichment layer and a large amount of adsorbed oxygen have been found at the surfaces of the films. Near the film surface Pb and Zr exist mainly in the forms of, besides Pb(Zr, Ti)03, metal Pb, metal Zr, oxygen-chemisorbed Pb, and various lead oxides. In addition, a small amount of lead, whose binding energy of Pb 4f7/2 is much lower than that of metal Pb, was observed at the film surfaces, but its chemical state is unknown up to now.
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U2 - 10.1007/s003390050692
DO - 10.1007/s003390050692
M3 - Article
AN - SCOPUS:0032045242
SN - 0947-8396
VL - 66
SP - 445
EP - 449
JO - Applied Physics A: Materials Science and Processing
JF - Applied Physics A: Materials Science and Processing
IS - 4
ER -